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Jiaxing AOSITE Photonics Technology Co.,Ltd.
saw grade quartz wafers
saw grade quartz wafers
saw grade quartz

SAW Grade Quartz Single Crystal Wafers

OST Photonics offer a variety of sizes and thicknesses of SAW grade Quartz single crystal wafers, with wafer diameters ranging from 3 inch to 8 inch, the thickness can be customized according to your requirements (generally above 0.08 mm). The orientations can be X/Y/Z/AT32/AT33/AT36/BT/ST42.75 etc. In addition, high quality quartz blanks (including left handed quartz) are also available.


Application of SAW Grade Quartz Single Crystal Wafers


  • Resonators and sensors in 5G communications

  • SAW devices in radar systems and satellite communications

  • Oscillators and sensors in navigation systems

  • Temperature compensate crystal oscillator (TCXO)

  • Oven controlled crystal oscillator (OCXO)



Advantages of SAW Grade Quartz Single Crystal Wafers


  • Stable thermal energy

  • Corrosion resistance

  • Superior light transmission

  • Super high insulation

  • High-temperature resistance



Ability of SAW Grade Quartz Single Crystal Wafers


  • Orientations: X/Y/Z/AT32/AT33/AT36/BT/ST42.75 etc.

  • Diameter: 3”, 4”, 6”, 8”

  • Thickness: 0.25mm, 0.35 mm, 0.5 mm, 1.0 mm etc.

  • Available items: crystal wafers, blanks and customized optics



Product Parameters of SAW Grade Quartz Single Crystal Wafers


Material

Quartz Crystal

Cutting Angle

X/Y/Z/AT32/AT33/AT36/BT/ST42.75 etc

Diameter

3”(76.2mm)

4” (100mm)

6"(150mm)

8"(200mm)

Diameter Tolerance(±)

≤0.20 mm

Thickness

≥0.08mm

≥0.10mm

≥0.20mm

≥0.35mm

Primary Flat

22mm

32mm

42.5mm

57.5mm

LTV (5mmx5mm)

<1µm

TTV

<3µm

Bow

-30<bow<30

Warp

<40µm

PLTV(<0.5um)

≥95%(5mm*5mm) with 2mm edge excluded

Orientation Flat

According to our standards or your requests

Surface Type

Single side polished(SSP)/double sides polished(DSP)

Polished side Ra

<0.5nm

Back Side Criteria

General is 0.2-0.5µm or as customized

Edge Criteria

Compliant with SEMI M1.2 Standard/refer to IEC62276

Material Property

ECD

Better than grade 4

Inclusion

Better than grade II

Q-Value

Better than grade C

Wafer Surface Criteria

Particles φ>0.3 µm

<= 30

Scratch , Chipping

None

Defect

No edge cracks, scratches, saw marks, stains

Packaging

Qty/Wafer box

25pcs per box



Product Parameters of SAW Grade Quartz Single Crystal Blanks


Material

Quartz Blanks

Materials

Both Pure Z and Y Bar available

Synthetic Q-Value

Min 1.8x10^6, 2.4x10^6 to 3.0x10^6  IEC

Etch Channel Density

Max 10/cm2, Max 30/cm2, Max 100/cm2, Max 100/cm2, Max 300/cm2; Swept

Inclusions Density

Ia, Ib, I, II, III

Cut Type

AT, BT, CT, DT, GT, NT, FC, SC, IT etc

Angle Tolerance(±)

Theta Angle: ±5″, ±10″, ±15″, ±30″, ±1′, ±2′ etc    

Phi Angle:±5′, ±10′, ±15′, ±30′ etc

Diameter For Round Blank

From 3.0mm to 50.80mm (with flat)

Size For Square Blank

1.6x1.6mm ~ 38x38mm

Size For SMD Blank

1.2x2.4mm Above at Customer option

Diameter/Size Tolerance(±)

±0.01 mm

Frequency

1 Mhz up to 54Mhz for AT-Cut Fundamental; Upto 70Mhz By Etching

Flat

As request the flat shall be perpendicular to X axis within ±10 deg

Surface Finishing

#1000(9u); #2000(7u); #3000(5u); #4000(3u) (Sic); Polished(Cerium oxide)and & etched Std  

Overtone

Fundamental; Third Overtone (3rd); Fifth Overtone (5th)

Contouring (Diopter)

Plano-Convex: 0.5 Diopter ~ 10 Diopter  Bi-Convex: 10 Diopter ~ 15 Diopter



Properties of SAW Grade Quartz Single Crystal Wafers


Density, g/cm3

2.65

Melting point, °C

1467

Thermal conductivity, W/(m x K) (T = 25°C)

10.7 (parallel to axis Z)      6.2 (perpendicular to axis Z)

Thermal coefficient of linear expansion at temperature range 0-25°Ñ, °C-1

7.1 õ 10-6 (parallel to axis Z)

13.2 õ 10-6 (perpendicular to axis Z)

Hardness (Mohs)

7

Specific heat capacity, J/(kg x K) (T = 25°C)

710

Dielectric constant at 30 MHz

4.34 (parallel to axis Z)      4.27 (perpendicular to axis Z)

Young's modulus (E), GPa

97.2 (parallel to axis Z)      76.5 (perpendicular to axis Z)

Shear modulus (G), GPa

31.14

Bulk modulus (K), GPa

36.4

Chemical stability

insoluble in water

Elastic coefficients

C11=87 C12=7 C44=58 C13=13 C14=18 C33=106



Synthetic Crystal Quartz Refractive Index VS Wavelength


l, mm

n0

ne

l, mm

n0

ne

l, mm

n0

ne

0.185

1.676

1.69

0.243

1.605

1.617

0.589

1.544

1.553

0.194

1.66

1.673

0.263

1.593

1.604

1.083

1.534

1.543

0.204

1.643

1.656

0.291

1.581

1.591

1.8

1.524

1.532

0.219

1.625

1.637

0.34

1.567

1.577

2.5

1.512

1.52

0.231

1.614

1.626

0.405

1.557

1.567

3

1.5

1.507



Quality Evaluation of Synthetic Quartz Crystal


a) The amount of crystal defect and impurity in synthetic quartz crystal depends on growth rate, mineralizer and raw material. The growth rate affects greatly to the important properties such as infra-red absorption coefficient α, which correlates to Q value, and frequency –temperature characteristics. The larger growth rate causes increase in α, decrease in Q value, and dispersion in frequency-temperature characteristics.


b) The quality index of synthetic quartz crystal was originally a Q value, and a 5 MHz quartz crystal unit operated in 5th overtone mode was used to obtain the Q value. But it required laborious work to fabricate the 5 MHz crystal unit, so the index had been changed to the coefficient α instead of the Q value.



Standard Specification for Synthetic Quartz Crystal


a) Twinning: There shall be no electrical or optical twinning in the usable region.


b) Strain: There shall be no strain contained both inside and surface of seed crystal as well as in a grown quartz crystal.


c) Cracks and fractures: There shall be no cracks, chippings or fractures in the usable region.


d) Inclusion density: The specification is in accordance with the IEC 60758.


Size range

Qty per cm3

Grade (µm)

10 to 30

30 to 70

70 to 100

>100

Ia

2

1

0

0

Ib

3

2

1

1

I

6

4

2

2

II

9

5

4

3

III

12

8

6

4


e) Infra-red quality indication: The specification is in accordance with the IEC 60758.


Grade

Max. α3585

Estimated Q values (x 106)

A

0.015

3.8

A

0.024

3

B

0.05

2.4

C

0.069

1.8

D

0.1

1.4


f) Etch channel density: The specification is in accordance with the IEC 60758.


Grade

Max. number per cm3

1

10

2

30

3

100

4

300

5

600



Specification for Lumbered Quartz Crystal


a) Angles:


i. Rotation angle of X-surface around Y-axis: 00°00’±15’


ii. Rotation angle of X-surface around Z-axis: 00°00’±15’


b) Dimensional tolerance:


i. Along X or Z axis:±0.1 mm


ii. Along Y axis:±10 mm


c) Surface roughness: as customized, lapped and polished are both available.


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Related SAW & Optical Grade Quartz Single Crystal Wafers
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Head Office: No. 66, 8 Group, Chengbei Village, Yanguan Town, Jiaxing 314411, China;

Hangzhou Branch: Room 1012, Chunhua Bussiness Center, No. 159, Hangbo Street, Shangcheng District, Hangzhou 310009, Zhejiang, China
Head Office: No. 66, 8 Group, Chengbei Village, Yanguan Town, Jiaxing 314411, China;

Hangzhou Branch: Room 1012, Chunhua Bussiness Center, No. 159, Hangbo Street, Shangcheng District, Hangzhou 310009, Zhejiang, China
sales@ostphotonics.com; info@ostphotonics.com +86-0571-86780460